Analytical scanning electron microscope JEOL JSM-IT510LA with cryo preparation system Quorum PP3010T
Manufacturer: JEOL Ltd. / Quorum Technologies Ltd.
Short description: Analytical scanning electron microscope (SEM) for high-resolution imaging of sample surfaces. Energy dispersive X-ray spectroscopy (EDS) can be used to detect and quantify chemical elements in samples and determine their spatial distribution. A low vacuum mode allows imaging of poorly conductive samples without coating. The cryo preparation system allows samples to be prepared at low temperatures, introduced into the SEM and examined.
Samples: Among others, thermoplastics, duromers, elastomers in the form of bulk material, films, fabrics, particles, foams
Extensive equipment is available for sample preparation.
| Technical data SEM | |
| Emitter | Thermal: LaB6 (changeable to W) |
| Acceleration voltage | 0.3 to 30 kV |
| Resolution (LaB6) |
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| Specimens |
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| Low vacuum mode | 10 to 650 Pa |
| Imaging detectors |
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| Energy-dispersive X-ray spectrometer (EDS) |
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| Technical data cryo preparation system | |
| Cooling SEM cold stage | down to -190 °C, temperature stability < 0.5 °C |
| Cold trap | down to -190 °C |
| Hold times | max. 24 h |
| Cryo sample preparation |
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The cryo scanning electron microscope is operated jointly with the Institute for Multiphase Processes IMP.
Funded by the Deutsche Forschungsgemeinschaft (DFG, German Research Foundation) – 467965905.
The conditions of use are outlined in the Nutzungsordnung des Labors für Kryo-Rasterelektronenmikroskopie.
